LUNA Innovations
LWA 7000 SERIES : Lightwave Component Analyzer
LWA 7601-C , LWA 7601-C (with extended rage option)
The LUNA LWA 7601-C instrument utilizes optical frequency domain reflectometry (OFDR) technology to measure backscattered or transmitted light as a function of distance/time (or wavelength). The extremely high sensitivity and sampling resolution (20 μm) make an ideal analyzer for photonic integrated circuits (PICs) and silicon photonics. When combined with the extended measurement range, up to 500 m measurement range is achieved, making the testing of fiber networks an easy task. The LWA 7601-C reduces the cost and complexity of test while increasing throughput by measuring RL, IL and length in reflection or transmission with a single instrument.
Key Features
- Return loss (RL) and insertion loss (IL) analysis
- Analyze components in reflection and transmission
- Trace distributed RL over length of optical path
- Spectral analysis of RL and IL
- Detect and precisely locate reflective events and measure path length (up to 500 m)
- Speed, resolution and accuracy for optimizing production test
- 20μm sampling resolution
- 12 Hz scan/acquisition rate (80 ms)
Applications
- Spatial RL testing
- Automated IL test and analysis
- Skew measurement with subpico second resolution
- PLCs, waveguide devices, AWGs, ROADMs, etc.
- Filters, couplers, switches, beam splitters, FBGs, specialty fibers
Specifications
| PARAMETER | SPECIFICATION | UNITS | ||
|---|---|---|---|---|
| Measurement | ||||
| LWA 7601-C | LWA 7601-C (with extended rage option) |
|||
| Maximum measurement length | Reflection | 100 | 500 | m |
| Transmission | 200 | 1000 | m | |
| Sampling resolution (two point) | 20 | 80 | μm | |
| Time-of-flight delay accuracy | ±0.01 | % | ||
| Wavelength scanning range | 1546.69 ± 20 | 1546.69 ± 5 | nm | |
| Measurement time (in continuous mode) | 0.08 (20 m) 0.4 (100 m) |
0.5 | s | |
| RL dynamic range | 70 | dB | ||
| Sensitivity | -135 | dB | ||
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